Reliability, Analysis Equipment
Reliability Inspection Equipment
| Equipment | Temperature & Humidity Range | |
|---|---|---|
| 1 | Thermal Shock Chamber (Hitachi ES-107LH) |
-70~200℃ |
| 2 | Thermal Shock Chamber (ESPEC TSA-71H-W) |
-65~150℃ |
| 3 | Thermal Shock Chamber (ESPEC TSA-101S-W) |
-65~150℃ |
| 4 | Low Temperature Chamber (ESPEC PG-2KPH) |
-70~150℃ |
| 5 | Low Temperature Chamber (-10deg min.) (ESPEC PU-3F) |
-10~100℃ |
| 6 | Temperature & Humidity Chamber (ESPEC PH-4FT) |
10℃~100℃ 60~98% |
| 7 | Temperature & Humidity Chamber (Applicable to temp. humi. cycle test) (ESPEC PL-2KPH) |
-40℃~100℃ 20~98% |
| 8 | Temperature & Humidity Chamber (Applicable to temp. humi. cycle test) (ESPEC PR-2F) |
-20℃~100℃ 20~98% |
| 9 | Temperature Chamber (ESPEC PV-220) |
~+200℃ |
| 10 | Temperature Chamber (ESPEC PH-100) |
~+200℃ |
| 11 | Temperature Chamber (ESPEC PH-200) |
~+200℃ |
| 12 | Temperature Chamber (SATAKE Satake41) |
~+150℃ |
| 13 | Highly Accelerated Stress Test Chamber (ESPEC EHS-411) |
- |
| 14 | Electrodynamic Vibration Testing System (IMV) |
- |
Analysis Equipment
| Equipment | |
|---|---|
| 1 | 2D X-Ray Inspection System (Shimadzu SMX-1000plus) |
| 2 | 2D X-Ray Inspection System (Toshiba TOSMICRON-S) |
| 3 | X-Ray Fluorescence Analyzer (XRF) (SII SEA1000A) |
| 4 | Optical Comparator (Nikon Profile Projector V-12) |
| 5 | Cut-Off Machine (Struers Labotom-5) |
| 6 | Material Preparation System (Grinding & Polishing) (Struers Tegramin-20) |
| 7 | Digital Microscope (KEYENCE VHX-900) |
| 8 | Roundness & Cylindricity Measurement System (Mitutoyo) |
| 9 | Surface Roughness Measurement System (Mitutoyo) |
| 10 | Angle Measurement System |
| 11 | Magnetic Analysis System for Magnet Roll |
